Optical properties of thin films are based on the properties of the bulk material. However, thin films are not always full density, and bulk properties must then be appropriately scaled. A review of phonon and multiphonon contributions to the complex index of refraction for common thin film materials such as oxides and fluorides is presented. Emphasis is on frequency and temperature dependence in terms of mathematical models.
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Michael E. Thomas (1991) studied this question.
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