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July 1, 1984Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena

High resolution electron energy loss studies of Fermi level states of clean and metallized Si(111) surfaces

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JDJ. E. DemuthIBM Research - Thomas J. Watson Research Center BPB. N. J. PerssonForschungszentrum Jülich

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Demuth et al. (1984) studied this question.

synapsesocial.com/papers/6a8409af7e95b97f4e72f612 https://doi.org/10.1116/1.582829

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