Thin liquid films can become structurally unstable and dewet, forming holes which subsequently grow on the substrate. Considerable research has been conducted on the structural evolution and growth of holes, which invariably are shown to be circular. We show that morphologies characterized by circular holes comprise one of three possible morphological regimes. In polystyrene films, supported by silicon oxide substrates, two other regimes are observed with decreasing film thickness. In the second regime, the moving boundary of the growing hole may become unstable and form fingers. The spacing between the fingers is characterized by a well-defined wavelength lambda proportional to h(7/6) M(-1/2) , where h is the film thickness and M is the molecular weight. A dense branchlike morphology characterizes the peripheral regions of the holes in the third regime and is found only in the thinnest films.
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Besancon et al. (2004) studied this question.
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