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The self-diffusion coefficient of aluminum has been determined in polycrystalline aluminum oxide over the range 1670° to 1905°C. Diffusion couples were employed using aluminum-26 in oxide form as a radioactive tracer. In the temperature range studied, experimental data can be represented by D = 28 exp {—[(114 000±15 000)/RT]}.
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Paladino et al. (1962) studied this question.
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