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August 1, 1998Applied OpticsOpen Access

Optical characterization of dielectric and semiconductor thin films by use of transmission data

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JCJorge CisnerosThe University of Texas at Austin

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Jorge Cisneros (1998) studied this question.

synapsesocial.com/papers/6a8432f0002ab1506fb2a211https://doi.org/10.1364/ao.37.005262
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