Influence of growth temperature on critical current and magnetic flux pinning structures in YBa2Cu3O7−x

We have studied the critical current density (Jc) as a function of applied magnetic field (H) magnitude and orientation for ∼1-μm-thick YBa2Cu3O7−x films grown by pulsed laser deposition at growth temperatures (Tg) from 730to870°C. With changing Tg, alternately a high density of planar defects (YBa2Cu4Ox intergrowths) or columnar defects (Y–Cu–O nanocolumns) are introduced. These defects produce a maximum for Jc(H∼1T) parallel to the plane of the film or the film normal, respectively. For Tg⩾830°C, we present evidence of a Ba–Cu–O liquid phase during growth, which results in a dramatic change in both the microstructure of the films and magnetic field orientation dependence of Jc.