This work presents the irradiation testing for the qualification of LabOSat-02, an On-Board Computer designed for nanosatellites. Its resilience to ionizing radiation in Low Earth Orbit environments is assessed. This is the first stage of a qualification process in which vibration and Thermal Vacuum Chamber tests are included. The system, based on a Cortex-R4F microcontroller and Ferroelectric RAM, was exposed to a 14 MeV proton beam at the EDRA beamline at CNEA's TANDAR accelerator, reaching a total fluence of8.1 · 10¹⁰~p/cm². Real-time telemetry, including the corrected RAM errors, temperature readings, and current consumption, were continuously acquired during irradiation. Results showed no latch-up events, stable power consumption, and no double-bit errors in internal SRAM. No functional degradation was observed in the external memories or peripheral interfaces. The total absorved dose by the microcontroller die was estimated to be 570 Gy (Si).
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