Orientated growth of V₂O₅electrochromic thin films on transparent conductive glass by pulsed excimer laser ablation technique

Highly c -axis orientated growth nano-crystalline V 2 O 5 films were successfully synthesized on In 2 O 3 :SnO 2 glass by using the laser ablation technique at deposition temperatures as low as 200°C. The structural properties of as-deposited and annealed VO x thin films were analysed using the scanning accessory of a transmission electron microscope, x-ray diffraction, Fourier transform infrared spectrum and Raman spectrum. Cyclic voltammograms showed no long-term degradation, at least up to 8000 cycles, and durability was verified to 60 000 cycles in the voltage range between -1.2 and 1.4 V. In situ spectroelectrochemical measurements were carried out. The optical spectra of V 2 O 5 thin films, as-prepared (deposited at 200 °C) and after 60 000 cycles, showed a significant change of the optical density in the visible range. It is demonstrated that these V 2 O 5 thin films are good candidates for cathode materials in rechargeable batteries and electrochromic devices.