High Angle X-ray Diffraction at Elevated Temperatures

By means of the electric furnace described here, the `back-reflexion' method of X-ray diffraction may be used at temperatures up to about 900 C. for single crystals and polycrystalline specimens. Constructional and operational details are given, and the attainment of higher temperatures discussed. Temperature, measured by a thermocouple, may be maintained to within ± 2° C.