We explore overcoming the non-oxidizing environment requirement issues in silicon oxide (SiO*x*) based memristors and investigate potential next steps for use of SiO*x* as a memristor material. A SiO*x*/HfO*x* stacked material was engineered, developed and tested to verify operation of the SiO*x*-based memristors, and the stacked material exhibits interfacial proton accumulation leading to ultra-low-voltage operation (<2 V). Also, a biomimetic self-recovery process (learning from the reactive oxygen species (ROS-like) production and regulation mechanism in mitochondria) has been demonstrated by a SiO*x*-based electrical device. The accumulative oxygen-induced ROS-like substance production in SiO*x*-based active electronics results in functional obstruction during the resistive switching transformation process, and further causes malfunction or a similar process to apoptosis (programmed cell death). The regulation system, also built-up by SiO*x*-based active electronics with neuromorphic learning, is designed for modulation of a ROS-like substance and provides an anti-ROS-like process to revive device functionality. The demonstrating of smart-material cycles in biomimetic self-recovery by SiO*x*-based active electronics represents critical milestones in future potential applications.
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Chang et al. (2018) studied this question.
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