Refractive indexes of the (Pb,La)(Zr,Ti)O(3) system are determined by minimum deviation for eight ceramic compounds over the 400-750-nm wavelength range and for two compounds over the 25-150 degrees C temperature range. The index of one compound (10/65/35) is reported to 2600 nm. Ellipsometric measurements show the presence of a low-index surface layer on these ceramics. Such layers, whose origin is not determined, have influenced previous index measurements based on reflection techniques.
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P.D. Thacher (1977) studied this question.
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