Skin-effect considerations on transient response of a transmission line excited by an electromagnetic pulse

The electromagnetic pulse can cause degradation of modern digital and analog devices. Many analytical models have been used extensively to study the susceptibility of equipment related to EMI/EMC (electromagnetic interference/electromagnetic compatibility) engineering, but the emphasis has been mainly on lossless transmission lines. This work takes into account the transient skin-effect of a transmission line exposed to a time-varying electromagnetic field. Beginning with the classical transmission line theory, the transient skin-effect of a transmission line and the equivalent sources due to the external fields are incorporated. As a result, an integral-differential equation is derived. By using the finite-difference-time-domain (FD-TD) approach, the induced voltages onto the line are predicted. There is also a discussion of the numerical approach and the propagation of the predicted induced voltage.>