The paper describes a novel technique for the measurement of monolithic millimetre wave circuits at 140 GHz. These circuits are measured using a coplanar waveguide probe which is linked via a dielectric waveguide to a multistate reflectometer. This reflectometer is mounted on a probe station, close to the circuit, and is connected via a flexible dielectric guide to an oscillator. The reflectometer is constructed using dielectric waveguide components and operates from 118 to 178 GHz. The paper shows some initial measurements of passive circuit components which are part of a set of coplanar waveguide test circuits on a gallium arsenide substrate at 140 GHz. The paper concludes with a discussion of the results.
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Boese et al. (1998) studied this question.
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