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A special "dual-measurement" procedure has been introduced for eliminating systematic interference in electromagnetic measurements. This interference has its origin in the same source as the measured signal and is usually picked up by the cables, chassis, and objects other than the sensor. The interference, when superimposed on the signal being measured, obscures the signal and degrades the accuracy of the measurement. The use of the dual-measurement procedure can notably reduce the systematic interference and greatly improve the clarity and accuracy of the measurement.
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Shen et al. (1984) studied this question.
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