The authors characterize experimentally the anisotropy of two-photon absorption and the Kerr nonlinearity in silicon over a broad spectral region in the near infrared using the z-scan technique. The results show that both of these parameters decrease by about 12% along the [0 1 0] direction compared with the [011¯] direction, and this change occurs for wavelengths in the range of 1.2–2.4μm.
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Zhang et al. (2007) studied this question.
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