We have studied the low-frequency noise in MgO-based magnetic tunnel junctions (MTJs) in serial configurations. Two types of junctions were compared: MTJ Wheatstone bridges and MTJ discrete resistors closely packed on a wafer die. We have characterized each individual junction to ensure that they have uniform parameters such as linear field sensitivity and noise level. In the array of bridges, the low-frequency noise decreases with an increasing number (N) of bridges, but does not scale with 1/√N, as expected from noise theory. The deviation is likely due to the statistical dispersions in MTJ bridge resistance and normalized voltage noise. The total noise of the discrete resistor series does not scale with 1/√N either, but rather exhibits a sinusoidal-like variation with N. We attribute it to the possible enhancement of noise from magnetic coupling among the tightly spaced MTJ elements.
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Zhang et al. (2011) studied this question.
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