High-resolution transmission electron microscopy was used to study the initial stages of the growth of submicroscopic (<50 Å) voids in thin evaporated gold films. These voids were found to grow while aging at room temperature as well as under conditions in which electromigration normally occurs. Room-temperature void growth was attributed to the annihilation of excess vacancies at voids.
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Lloyd et al. (1977) studied this question.
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