Oriented samples of Al 2 O 3 ‐ZrO 2 (Y 2 O 3 ) eutectics consisting of an alumina matrix with zirconia dispersoids were grown by directional solidification. Preferred growth directions and epitaxial relations were determined from X‐ray and electron diffraction analyses. Imaging of interfaces was performed by high‐resolution transmission electron microscopy on oriented platelets. Semicoherent interfaces were observed with faceting along crystallographic planes of both phases.
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Mazérolles et al. (1986) studied this question.
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