Reflectivity of coated and tilted semiconductor facets

A comparatively simple model for calculating the reflectivity of coated and tilted semiconductor facets is described. The model can be briefly described as follows: the forward-propagating waveguide field is propagated to the (tilted) facet, and a Fourier transformation is performed. Each angular component is then further decomposed into parallel and perpendicular components. Fresnel reflection coefficients are applied, and the coupling integral of the reflected field (in k-space) and the Fourier transform of the backward-propagating waveguide field are evaluated. The model takes the two-dimensional waveguide structure into account, includes polarization effects, and can be applied to multilayer coatings.>