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A near-infrared reflectivity exceeding 60% at 2.5-μm wavelength has been observed for a polycrystalline, rf sputter-deposited electrochromic (EC) WO3 film in a deeply colored state. This reflectivity is considerably higher than that previously reported for a thermally evaporated EC-WO3 film that was crystallized by a post-deposition thermal anneal. The shapes of the x-ray spectra of the two films are also different. The results of ellipsometry measurements of the optical constants provide convincing evidence for the validity of a free-electron Drude model to explain the reflectivity modulation observed in polycrystalline EC-WO3.
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Goldner et al. (1983) studied this question.
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