The objective of this work has been to correlate x-ray and infrared experimental scattering phenomena. X-ray topography and polarized infrared radiation have been used to study the stresses induced in single-crystal silicon wafers by electron-beam heating. The results of this work are discussed in relation to previous results of various investigators for stresses produced by several mechanisms. X-ray topographs showing four-lobed rosette patterns are presented together with an infrared birefringence pattern of the same electron-beam-spot area. Also illustrated and discussed is a triangular macrodefect observed by x-ray topography. The results presented herein have led to the conclusion that x-ray rosette patterns and infrared birefringence occur together and are due to thermally induced residual stress surrounding the electron-beam-spot areas. The results also indicate the need for additional experimental and theoretical work on the relation between scattering phenomena observed for electromagnetic radiations of different wavelengths.
No takes yet. Share an insight, caveat, or question.
Carron et al. (1967) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: