Evaluation of Threshold-Voltage Variation in Silicon on Thin Buried Oxide Complementary Metal–Oxide–Semiconductor and Its Impact on Decreasing Standby Leakage Current, Sugii, Nobuyuki, Tsuchiya, Ryuta, Ishigaki, Takashi, Morita, Yusuke, Yoshimoto, Hiroyuki, Iwamatsu, Toshiaki, Oda, Hidekazu, Inoue, Yasuo, Hiramoto, Toshiro, Kimura, Shin'ichiro
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Sugii et al. (2009) studied this question.
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