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October 1, 2008Review of Scientific Instruments

High resolution hard x-ray microscope on a second generation synchrotron source

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Authors

YTYangchao TianUniversity of Science and Technology of ChinaWLWenjie LiChina Academy of Engineering PhysicsJCJie ChenBeijing Institute of Technology

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Tian et al. (2008) studied this question.

synapsesocial.com/papers/6a86e0e848ef9afcd2a2483ehttps://doi.org/10.1063/1.3002484
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