Bimolecular recombination in xerographic photoconductors can contribute to effects which are essentially reciprocity failures. Such failures have been observed in aggregate photoconductors by comparing the surface potential—exposure behavior for low-intensity emission-limited discharge—with the behavior resulting from high-intensity flash exposures. The results show a high-intensity reciprocity failure which can be understood with a model based upon Langevin-type bimolecular recombination.
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Mey et al. (1979) studied this question.
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