We demonstrate 1.55-/spl mu/m buried-heterostructure (BH) vertical-cavity surface-emitting lasers (VCSELs) on a GaAs substrate. Thin-film wafer-fusion technology enables InP-based BH VCSELs to be fabricated on GaAs/AlAs distributed Bragg reflectors. Detailed investigations of the device resistance are also described. As a result of introducing BH and obtaining low device resistance, the threshold current density under CW operation shows the independence of mesa size due to a strong index guide and small noneffective current. A 5-/spl mu/m VCSEL exhibits a record threshold current of 380 /spl mu/A at 20/spl deg/C. This VCSEL also operates with single transverse mode up to the maximum optical output power.
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Ohiso et al. (2001) studied this question.
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