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The molecular-beam-epitaxial technique has been used to grow a high-quality GaAs negative electron affinity photocathode structure with a p-type beryllium doping concentration of 3×1019 cm−3. The reflection mode photoemission characteristics such as the white light sensitivity, the quantum efficiency, the minority carrier (electron) diffusion length, and the electron surface escape probability measured on such a cathode are described. The growth technique followed, offers a precise control over the layer thickness and doping level.
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Narayanan et al. (1984) studied this question.
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