Raman determination of structures of long-period SiC polytypes

Raman spectroscopy has been applied to identification of longer-period SiC polytypes. The stacking structures of 51R and 132R polytypes have been examined, the result of which is consistent with electron- and x-ray-diffraction analyses. The possibility is discussed for Raman determination of the period and stacking structure of longer period polytypes. It is demonstrated that Raman scattering is useful for the determination of the structure of SiC polytypes.