A fast noninvasive method based on scattering from a focused radially polarized light to detect and localize subwavelength nanoparticles on a substrate is presented. The technique relies on polarization matching in the far field between scattered and spurious reflected fields. Results show a localization uncertainty of ≈10⁻⁴λ² is possible for a particle of area ≈λ²/16. The effect of simple pupil shaping is also shown.
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Roy et al. (2015) studied this question.
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