The effects of film orientation on the ferroelectric and piezoelectric properties of (Bi 3.25 Ln 0.75 )Ti 3 O 12 (Ln=La, Nd, and Sm) films were investigated. The films were grown on (111)Pt/TiO 2 /SiO 2 /Si and (100)IrO 2 /TiO 2 /Si by pulsed laser deposition. The films grown on (111)Pt electrodes showed (001)/(117) mixed orientation. Nondoped films exhibited a highly preferred c -axis orientation. In contrast, a strong 117 peak was observed in the X-ray diffraction (XRD) patterns of (Bi 3.25 Sm 0.75 )Ti 3 O 12 films. The (117) orientation became dominant with decreasing radius of substituent ions. The films grown on (100)IrO 2 electrodes showed predominantly (111) and (110) orientation. The piezoelectric coefficient d 33f and remanent polarization P r were larger in (111)- and (110)-oriented films than in (001)- and (117)-oriented films.
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Adachi et al. (2007) studied this question.