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February 1, 1975IEEE Transactions on Electron Devices

An investigation of the siliconSapphire interface using the MIS capacitance method

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AGAlvin M. GoodmanBoston University

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Alvin M. Goodman (1975) studied this question.

synapsesocial.com/papers/6a87c579ed80d7e1abfe720fhttps://doi.org/10.1109/t-ed.1975.18078
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