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A powerful method for liquid crystal (LC) cell twist angle and retardation measurement is presented. This method is based on the spectroscopic ellipsometry. By varying the polarizer and analyzer angles only, a transmission spectrum containing null transmission at some particular wavelengths can be obtained. Analytical equations derived bases on a polarization analysis of twisted birefringent layers are then solved to give all the LC cell parameters. In general, the twist angle, twist sense, retardation, and the rubbing direction can all be determined. Measurement results on commercial liquid crystal display panels are presented.
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Tang et al. (2001) studied this question.
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