Typical X-ray spectra from high intensity pulsed X-ray sources were determined by means of an equivalent constant voltage accelerator. The photon energy spectrum for the forward X-ray beam was measured with various X-ray target thicknesses at accelerator voltages of 1.0, 1.5 and 2.0 MV. X-ray spectra were also obtained from a reflection X-ray target at angles of 7° and 45° with respect to the X-ray beam at applied potentials of 0.55, 1.0 and 2.0 MV. The dose rate dependence of thermoluminescent LiF, silver-activated phosphate glass, and dosimetry film was investigated over a range of dose rates extending from 104 to 1011 rad/sec with three separate flash X-ray systems.
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Tochilin et al. (1966) studied this question.