Application of Phase Contrast Transmission Microscopic Methods to Polymer Materials

Two methods for phase contrast transmission electron microscopy (PC-TEM) were put into practice; one is Zernike phase contrast TEM using a phase plate with a small hole in the center, and the other is the Hilbert differential contrast TEM using a semicircular phase plate. The contrast by PC-TEM is greatly improved from conventional TEM (C-TEM). Even the lamellar structure of block copolymer of polystyrene and polyisoprene could be observed by PC-TEM without electron staining. As the illumination condition for PC-TEM is almost the same as C-TEM, the radiation damage does not increase and the same sample as C-TEM can be observed. The ability to provide high contrast both for small and large structures of unstained specimens is the important feature of the PC-TEM.