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A new time-resolved Fourier transform infrared spectroscopy technique has been developed for commercial fast scanning interferometers. In contrast to the methods developed previously, this one has greater flexibility in the time resolution achievable (100 microseconds to seconds) and can be easily adapted to measure a variety of external experiments. Experiments are given demonstrating the correct operation of this technique and its applicability in following the deformation behavior in polymers.
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Lasch et al. (1984) studied this question.
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