The thickness dependence of the helical antiferromagnetic ordering temperature TN was studied for thin Ho metal films by resonant magnetic soft x-ray and neutron diffraction. In contrast with the Curie temperature of ferromagnets, TN was found to decrease with film thickness d according to [TN(∞)-TN(d)]/TN(d)∝(d-d₀)^-λ^', where λ^' is a phenomenological exponent and d₀ is of the order of the bulk magnetic period Lb. These observations are reproduced by mean-field calculations that suggest a linear relationship between d₀ and Lb in long-period antiferromagnets.
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Weschke et al. (2004) studied this question.
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