X‐ray fluorescence analysis of rocks by the fundamental parameter method

Improvements to the fundamental parameter algorithm of x‐ray fluorescence analysis are considered. The algorithm involves the following effects: primary and secondary x‐ray absorption, secondary and tertiary fluorescence, excitation by scattered x‐rays, excitation by photoelectrons and excitation by the divergent primary beam. The algorithm allows one to calculate the spectral intensity of x‐ray tubes with both thick and electron transmission targets. A version of the algorithm that can be handled on a low‐capacity computer is proposed. The algorithm was tested experimentally on the analysis of rocks, but its algorithm may be applied to different substances and materials.