Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
January 16, 1978physica status solidi (a)

Thickness determination of thin graphite and aluminium nitride foils by transmission electron microscopy using diffraction and energy loss analysis

View Full Paper
Ask AI
Bookmark
Share

Authors

CRC. J. RossouwMonash UniversityMWM. J. WhelanUniversity of Leicester

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

Rossouw et al. (1978) studied this question.

synapsesocial.com/papers/6a8865fa6304c7fd8e4e03d3https://doi.org/10.1002/pssa.2210450133
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Determination of the single-scattering probability distribution from plural-scattering data1974 · 147 citations
  2. 2Electron Interaction in Solids. Characteristic Energy Loss Spectrum1959 · 344 citations
  3. 3Inelastic scattering of 80 keV electrons in amorphous carbon1975 · 188 citations
  4. 4The buckling of a thin plate due to the presence of an edge dislocation1962 · 65 citations
  5. 5The determination of foil thickness by scanning transmission electron microscopy1975 · 576 citations