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The properties of the interface region of bulk, vapor-deposited, and single-crystal ice have been studied in a Knudsen cell flow reactor in the range 190−210 K using repetitive pulse experiments (RPEs) at variable frequency. Fluxes of surface-to-bulk loss in ice on single-crystal and bulk ice vary from 5 × 10 11 to 1 × 10 13 and from 5 × 10 12 to 5 × 10 14 molecule s -1 cm -2 for HCl and D 2 O, respectively. A positive activation energy for diffusional loss of E A = 3.0 ± 0.5 kcal/mol for HCl/ice and 5.3 ± 0.7 kcal/mol for D 2 O/ice has been measured. Complementary measurements (“dope and probe” experiments) of the HCl/ice interface region using the titration reaction of ClONO 2 + HCl → Cl 2 + ΗΝΟ 3 are in good agreement with the diffusional loss measurements from RPEs. These experiments allowed the evaluation of the thickness h of the interfacial region, defined as the near-surface region of the ice where HCl is immediately available for titration at a high rate. We measured h = 100 ± 10 nm for single-crystal ice, 200 ± 50 nm for vapor-deposited ice, and 1000 ± 200 nm for bulk ice samples. The modeling of our results according to the laws of diffusion leads to values of the HCl diffusion coefficient D HCl ranging from (4.0 ± 1.0) × 10 -14 to (2.8 ± 1.0) × 10 -12 cm 2 s -1 for single-crystal and bulk ice, respectively.
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Flückiger et al. (2000) studied this question.
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