Localized Electrografting of Vinylic Monomers on a Conducting Substrate by Means of an Integrated Electrochemical AFM Probe

An electrochemical lithographic tool for locally electrografting a non‐conducting organic coating on a conducting substrate with a submicrometer resolution is provided by atomic force scanning electrochemical microscopy (AFM‐SECM). The picture shows the topographic AFM image of the line pattern drawn with an AFM‐SECM tip on a gold surface by direct reduction of an aryl diazonium salt/acrylic acid electrolyte solution. magnified image Combinations of scanning electrochemical microscopy (SECM) with other scanning probe microscopy techniques, such as atomic force microscopy (AFM), show great promise for directing localized modification, which is of great interest for chemical, biochemical and technical applications. Herein, an atomic force scanning electrochemical microscope is used as a new electrochemical lithographic tool (L‐AFM‐SECM) to locally electrograft, with submicrometer resolution, a non‐conducting organic coating on a conducting substrate.