The possibilities and limits of structure refinement of Langmuir‐Blodgett films by means of symmetrical reflection of X‐rays are described using the example of a stearic acid multilayer. Three different techniques for the determination of the electron density profile from reflectivity data are compared: a Fourier method, a Patterson method, and model calculations. The important role of the a priori information for finding the best structure model is outlined.
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Reiche et al. (1992) studied this question.
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