Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
May 1, 1996Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

Real-time simultaneous optical-based flux monitoring of Al, Ga, and In using atomic absorption for molecular beam epitaxy

View Full Paper
Ask AI
Bookmark
Share

Authors

PPP. PinsukanjanaIntelliEPI (United States)WJW. Andrew JacksonUniversity College DublinJTJan Tofte

Discussion

Loading...

Member takes

Overview

Key Points

Key points are not available for this paper at this time.

Cite This Study

Pinsukanjana et al. (1996) studied this question.

synapsesocial.com/papers/6a893da25edafe343d92d071https://doi.org/10.1116/1.588887
View Full Paper
Ask AI
Bookmark
Share