Snap-shot optical polarization spectroscopy using radially polarized pulses

By using radially polarized pulses for excitation in degenerate four-wave mixing (DFWM) spectroscopy, we realize highly sensitive snap-shot measurement of optical anisotropies in semiconductor films. Because the radially polarized pulses exhibit spatially varying linear polarizations, the optical anisotropies in samples can be evaluated from the spatial distributions of DFWM signals without rotating the polarization of the excitation pulses. We measure the excitons in GaN layers and evaluate the energies of uniaxial strain and the spin-exchange interaction constant. Our results prove both the accuracy and sensitivity of the snap-shot measurement.