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The stability and magnitude of photovoltage response in (Pb0.97La0.03)(Zr0.52Ti0.4g)O_3 (PLZT) ferroelectric thin films were investigated in the present work. Photovoltage degrading in multi-cycle ultraviolet (UV) light illumination was observed in Au/PLZT/Pt sandwich capacitor configuration and in-plane polarized configuration with a pair of top Au interdigital electrodes. For the in-plane polarized configuration, which had a greatly enhanced electrode gap, the reduction ratio of photovoltage during multi-cycle UV illumination was significantly smaller hence the stability of photovoltage was greatly improved over the sandwich capacitor configuration. Trapping of photo-induced charges and polarization screening at the ferroelectric-electrode interfaces were found to be the major cause for the degrading of photovoltage in ferroelectric films. Furthermore, for the Au/PLZT/Pt capacitor, the magnitude and even the polarity of the photovoltage were remarkably affected by the asymmetric interfacial Schottky barriers due to the small photovoltage magnitude determined by the small film thickness.
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Qin et al. (2007) studied this question.
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