Detuning between the emission line and the Fabry-Pérot wavelength is a critical parameter for microcavity light-emitting diode (MCLED) design with regard to the efficiency and emission directionality. We present here a method to measure simultaneously the detuning and the linewidth of the source emitter on the device itself. This method uses numerical simulations and a fitting procedure with the angular emission pattern measured on the MCLED. It is accurate, nondestructive and easy to implement.
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Ochoa et al. (1999) studied this question.
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