Surface-barrier structure of Cu(001) from analysis of low-energy electron diffraction

High-resolution intensity measurements obtained by Dietz, McRae, and Campbell for low-energy electron diffraction from Cu(001) have been analyzed using an exact scattering treatment and a linear saturated image-barrier model. Theoretical fits of maxima and minima to {~}0.3 eV can be obtained by a range ({~}6 a.u.) of values of z₀, the origin of the image surface potential. A fit to 0.05 eV is obtained for z₀=-3.7 a.u. from the first row of atoms. Further experimental data at other incident angles must be similarly analyzed before this surface-barrier model can be confirmed for Cu(001).