We have measured the decay of local conductance in single-wall carbon nanotubes directly using conductance imaging atomic force microscopy. The decay lengths were in the range from 1900.3em0exnm to well over 30.3em0exμm. There are strong indications that these decay lengths are the result of depletion lengths around metallic/semiconducting carbon nanotube junctions, and that they are related to defects in the tubes.
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Stadermann et al. (2005) studied this question.
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