X-ray photoelectron spectroscopy (XPS) was used to determine the composition and chemical structure of epitaxial LaNiO3-x films obtained by a reactive dc magnetron sputtering. It was found that, in contrast to the samples synthesized by using solid state chemical reactions, the surface Ni/La concentrations ratio is close to the stoichiometric bulk value. The existence of at least three different forms of oxygen in "as grown" films is shown by XPS characterization. XP spectra have also revealed that lattice oxygen and hydroxide species are in cooperation at the film surface. The significant dehydration of both La and Ni hydroxides to corresponding oxides was observed on cleaning film by Ar + ion bombardment.
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V. Bondarenka (2006) studied this question.
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