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We demonstrate a general approach to identify and locate minority species at buried interfaces which are of fundamental interest in many fields of solid state research. The approach combines soft x-ray emission for bulk and photoelectron spectroscopy for surface sensitivity. In the present study, the interface between a thin CdS layer and a Cu(In, Ga)Se2 thin film solar cell absorber has been investigated, showing that Na impurities are localized at the buried CdS/Cu(In, Ga)Se2 heterojunction.
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Heske et al. (1999) studied this question.
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