Charge densities of two rutile structures: NiF2 and CoF2

X-ray diffraction data were collected at room temperature for two rutile structures, NiF 2 and CoF 2 . Two different crystals of each compound have been used in the experiments. Atomic and thermal parameters were derived from least-squares refinements of high-angle data [(sinθ)λ≥0.6 A -1 ]. The results of Fourier inversion of the differences between observed and model structure factors are presented and discussed in terms of difference density maps