Optimal AR-coating for optical waveguide devices

The authors have calculated the optimal index of refraction and thickness of an antireflection coating layer for optical modes (TE/TM) in semiconductor laser devices. They have taken into account various correction factors concerning the two-dimensional carrier gas, i.e. the change in photonic energy depending on the width of the quantum well, the resulting change in refractive indexes, and the change in effective masses of the carriers. The value square root n/sub eff/*-n/sub eff/* is the effective optical mode index. It is compared to the exact calculated value for the optimal coating index.>